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STQ1NE10L N-channel 100V - 0.3 - 1A - TO-92 STripFETTM Power MOSFET General features Type STQ1NE10L VDSS 100V RDS(on) <0.4 ID 1A Exceptional high dv/dt capability 100% avalanche tested Avalanche rugged technology Low threshold drive TO-92 Description This Power MOSFET is the latest development of STMicroelectronics unique "Single Feature SizeTM" strip-based process. The resulting transistor shows extremely high packing density for low on-resistance, rugged avalanche characteristics and less critical alignment steps therefore a remarkable manufacturing reproducibility. Internal schematic diagram Applications Switching application bs codes Order O Part number STQ1NE10L STQ1NE10L-AP Marking Q1NE10L Q1NE10L Package TO-92 TO-92 Packaging Tube Ammopak let o Pr e du o (s) ct so Ob - te le ro P uc d TO-92 (Ammopack) s) t( January 2007 Rev 5 1/13 www.st.com 13 Contents STQ1NE10L Contents 1 2 Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 2.1 Electrical characteristics (curves) ............................ 6 3 4 5 Test circuit ................................................ 8 Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 bs O let o Pr e du o (s) ct so Ob - te le ro P uc d s) t( 2/13 STQ1NE10L Electrical ratings 1 Electrical ratings Table 1. Symbol VDS VGS ID ID IDG IGS IDM (1) Absolute maximum ratings Parameter Drain-source voltage (VGS = 0) Gate-source voltage Drain current (continuous) at TC = 25C Drain current (continuous) at TC=100C Drain gate current (continuous) Gate source current (continuous) Drain current (pulsed) Value 100 16 1 0.6 50 50 4 3 0.025 6 400 Unit V V A A mA mA A PTOT(2) Total dissipation at TC = 25C Derating factor dv/dt(3) EAS(4) Tstg TJ Peak diode recovery voltage slope Single pulse avalanche energy Storage temperature Operating junction temperature 1. Pulse width limited by safe operating area. 2. 3. Related to Rthj -l ISD 1A, di/dt 200A/s, VDD V(BR)DSS, TJ TJMAX 4. Starting TJ = 25 oC, ID = 1A, VDD = 50V Table 2. Symbol RthJC RthJA Tl Thermal data Thermal resistance junction-case max Thermal resistance junction-ambient max Maximum lead temperature for soldering purpose bs O let o ro P e du ct (s) Parameter so Ob - te le ro P -55 to 150 uc d s) t( W W/C V/ns mJ C Value 40 125 260 Unit C/W C/W C 3/13 Electrical characteristics STQ1NE10L 2 Electrical characteristics (TCASE = 25C unless otherwise specified) Table 3. Symbol V(BR)DG IDSS On/off states Parameter Clamped voltage Zero gate voltage drain current (VGS = 0) Gate-body leakage current (VDS = 0) Gate threshold voltage Static drain-source ON resistance Test conditions ID = 250A, VGS = 0 VDS = Max rating VDS = Max rating TC = 125C VGS = 16 V VDS = VGS, ID = 250A VGS = 10 V, ID = 0.5 A VGS = 5 V, ID = 0.5 A 1 0.30 0.35 Min. 100 1 10 100 2.5 0.40 0.45 Typ. Max. Unit V A A nA V IGSS VGS(th) RDS(on) Table 4. Symbol gfs Ciss Coss Crss tr(on) tf td(off) tf Qg Qgs Qgd Dynamic Parameter Forward transconductance Input capacitance Output capacitance Reverse transfer capacitance Turn-on time Rise time Test conditions VDS = 15 V, ID = 0.5 A Turn-off delay time Fall time bs O let o Pr e Total gate charge Gate-source charge Gate-drain charge du o (s) ct so Ob - VDS = 25 V, f = 1MHz, VGS = 0 te le ro P Min. uc d Typ. 2 345 45 20 11 12 20 13 7 1.5 3.5 s) t( Max. Unit S pF pF pF ns ns ns ns ns nC nC nC VDD = 50 V, ID = 0.5 A, RG = 4.7 , VGS = 10 V Figure 12 VDD = 50 V, ID = 0.5 A RG = 4.7, VGS = 5 V Figure 12 VDD = 80 V, ID = 1A, VGS = 5V Figure 13 4/13 STQ1NE10L Electrical characteristics Table 5. Symbol ISD ISDM(1) VSD(2) trr Qrr IRRM Source drain diode Parameter Source-drain current Source-drain current (pulsed) Forward on voltage Reverse recovery time Reverse recovery charge Reverse recovery current ISD=1A, VGS=0 ISD = 1A, di/dt = 100A/s, VDD=30V, TJ = 100C 52 90 3.5 Test conditions Min. Typ. Max 1 4 1.5 Unit A A V ns nC A 1. Pulse width limited by safe operating area 2. Pulsed: pulse duration=300s, duty cycle 1.5% bs O let o Pr e du o (s) ct so Ob - te le ro P uc d s) t( 5/13 Electrical characteristics STQ1NE10L 2.1 Figure 1. Electrical characteristics (curves) Safe operating area Figure 2. Thermal impedance Figure 3. Output characteristics Figure 4. Transfer characteristics Figure 5. Transconductance bs O let o ro P e du (s) ct so Ob Figure 6. te le ro P uc d s) t( Static drain-source on resistance 6/13 STQ1NE10L Figure 7. Gate charge vs. gate-source voltage Figure 8. Electrical characteristics Capacitance variations Figure 9. Normalized gate threshold voltage vs. temperature Figure 10. Normalized on resistance vs. temperature Figure 11. Source-drain diode forward characteristics bs O let o Pr e du o (s) ct so Ob - te le ro P uc d s) t( 7/13 Test circuit STQ1NE10L 3 Test circuit Figure 13. Gate charge test circuit Figure 12. Switching times test circuit for resistive load Figure 14. Test circuit for inductive load Figure 15. Unclamped Inductive load test switching and diode recovery times circuit Figure 16. Unclamped inductive waveform bs O let o Pr e du o (s) ct so Ob - te le ro P uc d s) t( 8/13 STQ1NE10L Package mechanical data 4 Package mechanical data In order to meet environmental requirements, ST offers these devices in ECOPACK(R) packages. These packages have a Lead-free second level interconnect. The category of second level interconnect is marked on the package and on the inner box label, in compliance with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also marked on the inner box label. ECOPACK is an ST trademark. ECOPACK specifications are available at: www.st.com bs O let o Pr e du o (s) ct so Ob - te le ro P uc d s) t( 9/13 Package mechanical data STQ1NE10L TO-92 MECHANICAL DATA mm. MIN. 4.32 0.36 4.45 3.30 2.41 1.14 12.70 2.16 0.92 0.41 5 TYP MAX. 4.95 0.51 4.95 3.94 2.67 1.40 15.49 2.41 1.52 0.56 MIN. 0.170 0.014 0.175 0.130 0.094 0.044 0.50 0.085 0.036 0.016 5 inch TYP. MAX. 0.194 0.020 0.194 0.155 0.105 0.055 0.610 0.094 DIM. A b D E e e1 L R S1 W V bs O let o Pr e du o (s) ct so Ob - te le ro P uc d s) t( 0.022 0.060 10/13 STQ1NE10L Package mechanical data bs O let o Pr e du o (s) ct so Ob - te le ro P uc d s) t( 11/13 Revision history STQ1NE10L 5 Revision history Table 6. Date 21-Jun-2004 31-Oct-2006 31-Jan-2007 Revision history Revision 3 4 5 Complete version Document has been reformatted Typo mistake on Table 1. Changes bs O let o Pr e du o (s) ct so Ob - te le ro P uc d s) t( 12/13 STQ1NE10L Please Read Carefully: Information in this document is provided solely in connection with ST products. STMicroelectronics NV and its subsidiaries ("ST") reserve the right to make changes, corrections, modifications or improvements, to this document, and the products and services described herein at any time, without notice. All ST products are sold pursuant to ST's terms and conditions of sale. Purchasers are solely responsible for the choice, selection and use of the ST products and services described herein, and ST assumes no liability whatsoever relating to the choice, selection or use of the ST products and services described herein. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted under this document. If any part of this document refers to any third party products or services it shall not be deemed a license grant by ST for the use of such third party products or services, or any intellectual property contained therein or considered as a warranty covering the use in any manner whatsoever of such third party products or services or any intellectual property contained therein. UNLESS OTHERWISE SET FORTH IN ST'S TERMS AND CONDITIONS OF SALE ST DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY WITH RESPECT TO THE USE AND/OR SALE OF ST PRODUCTS INCLUDING WITHOUT LIMITATION IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE (AND THEIR EQUIVALENTS UNDER THE LAWS OF ANY JURISDICTION), OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT. 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All other names are the property of their respective owners. let o Pr e du o (s) ct so Ob - te le ro P uc d s) t( ST and the ST logo are trademarks or registered trademarks of ST in various countries. Information in this document supersedes and replaces all information previously supplied. (c) 2007 STMicroelectronics - All rights reserved STMicroelectronics group of companies Australia - Belgium - Brazil - Canada - China - Czech Republic - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan Malaysia - Malta - Morocco - Singapore - Spain - Sweden - Switzerland - United Kingdom - United States of America www.st.com 13/13 |
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